Characterisation

The samples produced in the CM group require sophisticated measurement techniques. We determine the electrical, structural and magnetic properties of our samples over a range of temperatures and magnetic fields.

Our magnetometry apparatus is used to measure the magnetisation and magneto-optical properties of thin films or bulk samples.
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The CM group possesses a range of scanning microcscopes techniques including STM, AFM, MFM, SEM and TEM.
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The structural properties of our samples can be examined using a range of techniques including x-ray diffraction and Raman spectroscopy.
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The group possesses a range of equipment designed to investigate the electrical transport properties of materials and devices.
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